{"id":197,"date":"2024-10-18T18:47:50","date_gmt":"2024-10-18T18:47:50","guid":{"rendered":"https:\/\/advancedmicrotesting.com\/?page_id=197"},"modified":"2024-10-18T18:47:50","modified_gmt":"2024-10-18T18:47:50","slug":"collaborators","status":"publish","type":"page","link":"https:\/\/advancedmicrotesting.com\/index.php\/collaborators\/","title":{"rendered":"Collaborators"},"content":{"rendered":"\n<div class=\"wp-block-media-text alignfull is-stacked-on-mobile\" style=\"grid-template-columns:15% auto\"><figure class=\"wp-block-media-text__media\"><img loading=\"lazy\" decoding=\"async\" width=\"459\" height=\"606\" src=\"https:\/\/advancedmicrotesting.com\/wp-content\/uploads\/2024\/10\/Dominique-D.jpg\" alt=\"\" class=\"wp-image-198 size-full\" srcset=\"https:\/\/advancedmicrotesting.com\/wp-content\/uploads\/2024\/10\/Dominique-D.jpg 459w, https:\/\/advancedmicrotesting.com\/wp-content\/uploads\/2024\/10\/Dominique-D-227x300.jpg 227w\" sizes=\"auto, (max-width: 459px) 100vw, 459px\" \/><\/figure><div class=\"wp-block-media-text__content\">\n<h2 class=\"wp-block-heading\">Dominique Drouin<\/h2>\n\n\n\n<p><strong><em>Collaborator<\/em><\/strong> <strong><em>(UdS)<\/em><\/strong><\/p>\n\n\n\n<p><strong>Prof. Dominique Drouin\u00a0<\/strong>(PI-UdeS) from the Electrical and Computer Engineering Department since 1999 is currently holding a NSERC\u00a0<em>Senior Industrial Research Chair<\/em>\u00a0since 2014 in collaboration with IBM. Prof Drouin is internationally renowned for his microfabrication expertise applied on advance packaging, quantum technologies and artificial intelligence hardware.\u00a0He has published > 300 papers in scientific journals and conference proceedings that have been cited over 6,200 times.<\/p>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-media-text alignfull is-stacked-on-mobile\" style=\"grid-template-columns:15% auto\"><figure class=\"wp-block-media-text__media\"><img loading=\"lazy\" decoding=\"async\" width=\"456\" height=\"611\" src=\"https:\/\/advancedmicrotesting.com\/wp-content\/uploads\/2024\/10\/Fabien-A.jpg\" alt=\"\" class=\"wp-image-200 size-full\" srcset=\"https:\/\/advancedmicrotesting.com\/wp-content\/uploads\/2024\/10\/Fabien-A.jpg 456w, https:\/\/advancedmicrotesting.com\/wp-content\/uploads\/2024\/10\/Fabien-A-224x300.jpg 224w\" sizes=\"auto, (max-width: 456px) 100vw, 456px\" \/><\/figure><div class=\"wp-block-media-text__content\">\n<h2 class=\"wp-block-heading\">Fabien Alibart<\/h2>\n\n\n\n<p><strong><em>Collaborator<\/em><\/strong> <strong><em>(CNRS)<\/em><\/strong> <\/p>\n\n\n\n<p><strong>Fabien Alibart<\/strong> received a PhD in materials science from the University of Amiens, Amiens, France, in 2008. He is currently a permanent researcher at the Institute of Electronic, Microelectronic and Nanotechnology, CNRS, France. His research activities concern the development of neuromorphic devices and circuits from fabrication to proof-of-concept realization.<\/p>\n<\/div><\/div>\n","protected":false},"excerpt":{"rendered":"<p>Dominique Drouin Collaborator (UdS) Prof. Dominique Drouin\u00a0(PI-UdeS) from the Electrical and Computer Engineering Department since 1999 is currently holding a NSERC\u00a0Senior Industrial Research Chair\u00a0since 2014 in collaboration with IBM. Prof Drouin is internationally renowned for his microfabrication expertise applied on advance packaging, quantum technologies and artificial intelligence hardware.\u00a0He has published > 300 papers in scientific [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_editorskit_title_hidden":false,"_editorskit_reading_time":0,"_editorskit_is_block_options_detached":false,"_editorskit_block_options_position":"{}","footnotes":""},"class_list":["post-197","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/pages\/197","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/comments?post=197"}],"version-history":[{"count":5,"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/pages\/197\/revisions"}],"predecessor-version":[{"id":512,"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/pages\/197\/revisions\/512"}],"wp:attachment":[{"href":"https:\/\/advancedmicrotesting.com\/index.php\/wp-json\/wp\/v2\/media?parent=197"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}